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My bad, I didn't realize that group_path doesn't work on In_to_Out path.
Correction: the following will work
report_timing -from [all_inputs] -to [all_outputs]
I think you already constrained your input/output ports by:
set_input_delay -max 0.3 -clock ${CLK} [remove_from_collection [all_inputs] [get_ports ${CLK}]]
set_output_delay -max 0.3 -clock ${CLK} [all_outputs]
May be you can try:
group_path -name In_to_Out -from [all_inputs] -to...
From my point of view, timing analysis tells you about how likely your circuit would work. You probably shouldn't make any assumption about what it didn't tell you. In your case::
If you are using min delay corner for hold time analysis; and you have hold time violations. Then, it doesn't...
Maybe you can look for the user guide of nanosim if you have nanosim in your system (I cannot find it online).
.out is the default output waveform of nanosim (transistor level simulator of Synopsys). You can open it with Synopsys's nwave or custom waveview.
You can also use Gaw, they have...
The core wrapping flow that I mentioned above doesn't have a BYPASS mode. Tough I know there are similar flows like IEEE 1500 flow and boundary scan flow that provide a BYPASS mode. Again, DFT compiler can help you with those.
# IEEE 1500 example:
set_dft_configuration -ieee_1500 enable
#...
First, you need to add a test wrapper to your core design. DFT compiler can help you with this, but you need to provide it with appropriate commands:
# specify your INTEST/EXTEST Encoding
define_test_mode INT_TEST -usage wrp_if -encoding {test_mode0 1 test_mode1 0}
define_test_mode EXT_TEST...
I don't understand what you are trying to achieve? You want to do both INTEST and EXTEST? Or you just want to improve test coverage?
A test wrapper is necessary to provide both test access and test isolation. You can't do INTEST and EXTEST without a test wrapper chain placed along the boundary...
Maybe you can try to create a scan mux as follows:
assign SCLK = scan_mode ? 1'b0 : input_clk;
Then, declare the scan_mode port as ScanMode in your dft script:
set_dft_signal -view existing -port scan_mode -active_state 1 -type ScanMode
If you're trying this, pls let me know if it works.
Thx.
Did you use the input clock that you mentioned as a ScanClock?
Maybe you can add a scan mux to bypass it in ScanMode.
By the way, it would be easier if you could provide more information about your DFT architecture (e.g. the script u used for scan stitching).
Thanks.
Do you write the slave yourself? The way you described your problem, it looks like both the CDMA and the interconnect are not written by you.
Assuming you are using AXI-MM, it recognizes each master by assigning them with a unique ID. I guess either both your master use the same ID (e.g. arid...
The power report of PrimeTimePX does give us the average power consumption of a circuit. You can multiply the reported power by the total simulation time to get the amount of energy consumed by each function.
Let's say you have 7 different functions. You can write 7 different testbenches, each...
It is true that the whole test process (excluding the maybe the initial test setup follows a regular load/unload -> measure/capture pattern.
However, test_se is (mostly) not always asserted in measure/capture cycles. In measure capture cycles, DFT compiler treats the scan-enable signal like any...
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