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Recent content by andrew_ww

  1. A

    Design for testability - time limits in practice

    Let we assume, it is high volume (continuous pressure on both: more cheap die and more test speed).
  2. A

    Design for testability - time limits in practice

    Hi! I would like to ask about optimized DFT in practice. In nuthsell, how much time it is supposed to consume to test a new ASIC ? (After it is manufactured, and shipped from the fab.) If i want less time to test, i should build in more complex self-tests, use more silicon. With zero amount of...
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