hosseineslahi7
Junior Member level 1
Dear all,
I have designed a DAC the switching speed of which is around 1-2 GHz. I know that adding several analog test point (ATP) circuits for measuring the analog signals in low frequencies is inevitable. I have added a simple ATP structure reported in the following paper, however, this topology is suitable for low-frequency measurement:
ieeexplore.ieee.org
Does anyone know of another test circuit for measuring the output of a high-speed switching DAC? I need to add it to my layout before taping it out.
Regards
Hossein
I have designed a DAC the switching speed of which is around 1-2 GHz. I know that adding several analog test point (ATP) circuits for measuring the analog signals in low frequencies is inevitable. I have added a simple ATP structure reported in the following paper, however, this topology is suitable for low-frequency measurement:
Electronically programmable test points for on-chip analog/digital measurements
This paper presents a flexible solution for performing measurements of internal chip signals at the bench, which reduces overall system costs and test risks. It also makes available a way to insert signals at predefined nodes and to bring the system to a specified state. For this purpose, we use...
ieeexplore.ieee.org
Does anyone know of another test circuit for measuring the output of a high-speed switching DAC? I need to add it to my layout before taping it out.
Regards
Hossein
