rajsach13
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Hello !!
I would like to understand better the Standard Cell characterization step for a classic Flip-Flop without any Testability neither inverted Output.
Let's say in 40nm CMOS.
How is the setup/hold time computed, I mean what is the strategy to get the setup/hold time values in the .lib files ?
Does everything start from an initial range of setup coming from the Techno team, let's say for example : setup inside [20ps:120ps] for a FF drive X1 ? And then, does the characterization step will end to write in the .lib, the setup value such as the Q output gets well the D data input, the D data input being closer and closer to the clock rising edge (and so reducing the setup value)?
Thanks a lot for your help.
R.
I would like to understand better the Standard Cell characterization step for a classic Flip-Flop without any Testability neither inverted Output.
Let's say in 40nm CMOS.
How is the setup/hold time computed, I mean what is the strategy to get the setup/hold time values in the .lib files ?
Does everything start from an initial range of setup coming from the Techno team, let's say for example : setup inside [20ps:120ps] for a FF drive X1 ? And then, does the characterization step will end to write in the .lib, the setup value such as the Q output gets well the D data input, the D data input being closer and closer to the clock rising edge (and so reducing the setup value)?
Thanks a lot for your help.
R.