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Scan Insertion Test Protocol

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sampham04

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Hi,

I am trying to insert a scan chain into the s27 circuit using Synopsys DC and I am having trouble writing the test protocol. When I create the test protocol I am using the command:

create_test_protocol -capture_procedure single_clock

to specify that I do not want multiple clocks, but when I try to write the test protocol in a .spf file using the command:

write_test_protocol -out s27_dut.spf

I get the following warning:

Warning: The multi-clock protocol requires that the strobe time be before a clock's pulse if it is used for transition fault testing. (TESTXG-56)

I don't understand why I am getting this warning since I specified the there should only be one clock.

Can anyone help me fix this problem, please?

Thank you!
 

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