MAPLE LEAF
Newbie level 4
Hi all,
How can I generate test patterns with don't care bits left unspecified (for several ISCAS89 benchmarks)?
FastScan compresses patterns automatically as part of the "create patterns" command, so no don't care bits in the test vectors. I tried another ATPG tool -- Atalanta (**broken link removed**). Option "-D n" allows the tool derive n test patterns for each fault, but that leads to too much patterns (fault number is always huge). Another option "-c n" can be used to compact the pattern. Thought patterns are reduced, all don't cares are specified to 0 or 1.:-(
how can I generate test patterns with Xs, while test set is not too large?
Thanks & Regards.
How can I generate test patterns with don't care bits left unspecified (for several ISCAS89 benchmarks)?
FastScan compresses patterns automatically as part of the "create patterns" command, so no don't care bits in the test vectors. I tried another ATPG tool -- Atalanta (**broken link removed**). Option "-D n" allows the tool derive n test patterns for each fault, but that leads to too much patterns (fault number is always huge). Another option "-c n" can be used to compact the pattern. Thought patterns are reduced, all don't cares are specified to 0 or 1.:-(
how can I generate test patterns with Xs, while test set is not too large?
Thanks & Regards.
