am new to dft field, i did simulation chain & scan, chain passed, but in scan simulation parallel passed but serial is failing. pls help me to fix this.
I think the OP is talking about simulating a scan-chain inserted design by using test-patterns generated by an ATPG tool.
But I think he/she is too naive to explain what has actually been done and what is the target intention.
As told in #2, without more info no one can help you.
am new to dft field, i did simulation chain & scan, chain passed, but in scan simulation parallel passed but serial is failing. pls help me to fix this.
Hello, Actually, I don't know about your issue in detail.
I guess that scan simulation you mentioned is pattern validation process using simulation tool(such as NC-verilog, VCS..)
Serial simulation is more similar as real-case that parallel simulation.
So, I guess It's not real fail..
Please check force & release time at testbench.
Parallel pattern means you forcing in scan shift and focus on capture cycle only.
Chain or sample pattern means this kind of pattern is real ( shift in/out from/to IO)
For example in your design the maximum chain length is 100 this mean :
Parallel only costs 1x2 shift cycle + 1 capture cycle -> boost up simulation time only
Serial costs 100x2 shift cycle + 1 capture cycle