Mismatch parameter variation distributions (for transistors, resistors, capacitors, ...) for min. and max. (i.e. fixed) Process, Voltage & Temperature parameter combinations ("corners").
But how is this different from local and global ... I am especially concerned because the spread is much larger for mcminmax than local , global or local +global
Is mcminmax the most realistic simulation for yield/spread estimation or is it just overkill?
But how is this different from local and global ... I am especially concerned because the spread is much larger for mcminmax than local , global or local +global
Is mcminmax the most realistic simulation for yield/spread estimation or is it just overkill?
Local, global or local+global just includes Process mismatch variations, noVoltage or Temperature variations.
mcminmax contains localPVT variations
For spread over 1 wafer you need mcminmax, if you're interested in getting good chips within the full local PVT min/max range.
For yield estimation for 1 single wafer you need the local set if you want to see how many of the chips fulfill the typ. conditions. For the yield of chips which fulfill the min/max (i.e. all) corners' conditions, use both the local+mcminmax models' sets.
For yield estimation for batch-to-batch production you need the local+global set if you want to see how many of the chips fulfill the typ. conditions. For the yield of chips which fulfill the min/max (i.e. all) corners' conditions, use all 3 local+global+mcminmax models' sets together.
So do you mean that in mcminmax, it also varies the set temperaure say set at 100 degrees between different nodes in the ckt. and the applied input voltages from the ideal sources?
So do you mean that in mcminmax, it also varies the set temperaure say set at 100 degrees between different nodes in the ckt. and the applied input voltages from the ideal sources?
No, this would be totally unrealistic. mcminmax model set allows for analysis parameter combinations between the (foundry defined) local mismatch variations, possible power supply variation (e.g. 1.8V±10%), and possible temperature variation (e.g. -40°C .. +105°C). V&T min/max ranges can be determined by the user.
The MC randomly selected PVT parameters are valid for all devices on the chip, resp. for all chips on the same (local) or all (global) wafer(s).
Ok..so if i am designing my chip to work at only a particular temperature and well-contolled supply/other inputs, local+global montecarlo should be sufficient, right?
Ok..so if i am designing my chip to work at only a particular temperature and well-contolled supply/other inputs, local+global montecarlo should be sufficient, right?