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There are quite a few methods can be used to measure NF- you can find some of the materials from different sites. However, to measure NF using SA, you would require noise source, I am attaching a document from Anritsu, please note: the goal of this note is to get an idea about the NF measurements.
For some spectrum analysizers (like Agilent's), to measure NF you need a noise source with the firmware option which supports Y-factor method. There is another solution called "gain method", but it's not suitable for low NF component use. You can google it to find the details.
There are quite a few methods can be used to measure NF- you can find some of the materials from different sites. However, to measure NF using SA, you would require noise source, I am attaching a document from Anritsu, please note: the goal of this note is to get an idea about the NF measurements.
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