bitseddyboy
Newbie level 2
Is there a flow available to do partial scan insertion using Synopsys DFT Compiler?
I want to select only a few flip-flops in my design based on controllability and/or observability analysis to include it in scan chain. Is there a way to do it. The real question is to identify the flops which needs to be scanned so that fault coverage increases.
My search for this in Solvenet was not successful since I did not come across much information on partial scan insertion.
Could you please help me out.
Thanks in advance
I want to select only a few flip-flops in my design based on controllability and/or observability analysis to include it in scan chain. Is there a way to do it. The real question is to identify the flops which needs to be scanned so that fault coverage increases.
My search for this in Solvenet was not successful since I did not come across much information on partial scan insertion.
Could you please help me out.
Thanks in advance