I would like to understand various Faults which can occur during a SRAM testing.
I understand that there are SAF, TRN , CF faults etc.
But I'm looking for an indepth description of these faults.
I tried googling but has not resulted in much returns.
Conventional faults in RAM's are:
Stuck-At Fault (SAF)-Cell or line sticks at 0 or 1.
Transition Fault (TF)-Cell fails to transit from 0 to 1 or 1 to 0.
Stuck-Open Fault (SOF)-Cell not accessible due to broken line.
State Coupling Fault (CFst)-Coupled cell is forced to 0 or 1 if coupling cell is in given state.
Address-Decoder Fault (AF)-A functional fault in the address decoder