ananthashayanams
Junior Member level 2
Hi
I am involved in generating ATPG patterns for a relatively big chip making these patterns work on real Silicon. The problem is, the chain test is failing as well as scan test in the ATE. If the results are looked then it's coming from 8 chains and these are causing the failures in both Shift & Capture.
I want to make sure my Shift passes. I tried adjusting the clock which goes into the error block, strobing it +/- 4 cycles but nothing changed , Tried from 1MHz - 40 MHz and the failures are the same. Looks like some real failures.
Could anybody suggest me anything at this juncture to move ahead and try making these shift patterns pass. Anything to take care during pattern generation.
btw the tool used is Mentor TestKompress with EDT on
I am involved in generating ATPG patterns for a relatively big chip making these patterns work on real Silicon. The problem is, the chain test is failing as well as scan test in the ATE. If the results are looked then it's coming from 8 chains and these are causing the failures in both Shift & Capture.
I want to make sure my Shift passes. I tried adjusting the clock which goes into the error block, strobing it +/- 4 cycles but nothing changed , Tried from 1MHz - 40 MHz and the failures are the same. Looks like some real failures.
Could anybody suggest me anything at this juncture to move ahead and try making these shift patterns pass. Anything to take care during pattern generation.
btw the tool used is Mentor TestKompress with EDT on