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[SOLVED] Partial scan chain using DFT compiler

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leorezende93

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Hi,

I found this link in the forum with a problem that i solved: https://www.edaboard.com/showthread.php?t=319722

However, i cannot answer anymore, so I created this new thread.

The Nangateopencelllibrary 45 nm SDFF has a problem in the .lib file.

The .lib does not present a "test_cell" function. Its necessary include something like the following lines in the SDFF .lib to allow the tool to recognize de SDFF and replace the standard flops:

Code:
test_cell() {
	pin(CKN) { direction : input; }
 	pin(D) { direction : input; }
 	pin(Q) { direction : output; signal_type : test_scan_out; }
 	pin(QN) { direction : output; signal_type : test_scan_out; }
 	pin(RN) { direction : input; }
 	pin(SE) { direction : input; signal_type : test_scan_enable; }
 	pin(SI) { direction : input; signal_type : test_scan_in; }
 	pin(SN) { direction : input; }
 	ff (P0000,P0003) { 
           next_state : "D";
   	   clocked_on : "!CKN";
 	   clear : "(!RN)";
	   preset : "(!SN)";
 	   clear_preset_var1 : H;
 	   clear_preset_var2 : L; 
        }
}
 
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