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Why coverage low in transition fault model as compared to stuck at fault model?

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alp507

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why & how transition fault model give lower coverage as compared stuck at fault model?
 

Transition fault model has something to do with the speed. It's usually used for newer process technology when testing at ATE clock speed is no longer enough. I guess what you are looking for is a proper OCC controller, which allows you to shift data at slower late, but test circuit at a much faster rate.
 

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