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I assume you are talking about JTAG BoundaryScan?
The Boundary scan cells are "electronic testpins", which are built into several µC and other ICs, similar to testpoints on traces.
They allow to test connections, e.g. from inside BGA IC via ball and trace to ext. testpoints.
I assume you are talking about JTAG BoundaryScan?
The Boundary scan cells are "electronic testpins", which are built into several µC and other ICs, similar to testpoints on traces.
They allow to test connections, e.g. from inside BGA IC via ball and trace to ext. testpoints.
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