mohdfaaf
Junior Member level 2
Need any input/suggestion on this:
It is found that on some I/O pins the esd margin has significantly degraded on CDM testing. Failure analysis showed the diode ( in the esd basic cell ), was damaged. The mystery lies in this damage only affects certain I/O pins not others. And other i/o pin actually has the same esd cell used. ( same circuit block - but layout wise not confirmed the same yet to this time )
Any input or suggestion on finding the root cause is greatly appreciated.
It is found that on some I/O pins the esd margin has significantly degraded on CDM testing. Failure analysis showed the diode ( in the esd basic cell ), was damaged. The mystery lies in this damage only affects certain I/O pins not others. And other i/o pin actually has the same esd cell used. ( same circuit block - but layout wise not confirmed the same yet to this time )
Any input or suggestion on finding the root cause is greatly appreciated.