shgh4a
Newbie level 1
Hi There,
I am looking for journal or technical papers to show that the insertion loss of CPW on HR Si wafer may be improved when it is measured on thick insulator layer like alumina or glass, not directly on metal chuck in the probe station.
Thanks.
I am looking for journal or technical papers to show that the insertion loss of CPW on HR Si wafer may be improved when it is measured on thick insulator layer like alumina or glass, not directly on metal chuck in the probe station.
Thanks.