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I have used serial testbench for the chain pattern. With this simulation is failing. To debug this I have run parallel simulation with post_shift to idendify the failing flop. Is it the right approach ?
How to decide compression ratio ? what is the limitation on compression ? will it affect coverage ?
Is there any generic architecture for compression ? please provide good document on scan compression
I am working on scan insertion. I have some querries on the same.
My understanding is lockup latch is not needed when we have negedge flop followed by pos edge flop. But when we have pos edge flop followed by neg edge flop, can I use lockup latch between pos edge -> lockup latch -> neg...
Please help me in understanding the following,
How to debug chain test failure ? How to find the failure flop for chain test patterns?
What is the pattern used for chain test ? is it specific to the tool or can it be same for all ?
transition and path delay
If the coverage of the transition faults if high enough, does that mean we need not go for path delay test? or is it that path delay selection depends on the number of clock domains or IDDQ results or frequency of the design ?