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Re: DFT explanation
What is difference between, Test_mode (TM) pin and Scan_Enable pin?
Test_mode pin is use to put SOC/ASIC into TEST MODE or Functional mode. There are various test modes in DFT like ICTECT, IDDQ, IO BIST , AC/DC TEST, MBIST, JTAG etc. Scan_enable is only significant in the...
I am doing top level MBIST pattern generation and simulation for a modlue . While pattern simulation i am gettin Read margine violation for the RAM but my simulation is passing. I think it might be due to the clock frequency going in to the RAM.
I want to know what is the effect of this...
hi i had currently started working on the Mentors Fastscan and its supporting tool.
can anyone tell how to trace the cause of UO(unobservable fault).
should i forwrd trace it or backtrace it????????????