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SCAN based and Boundry Scan

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nani_1981

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Hi,
I wanted to know what is the major difference between the SCAN based testing and Boundary scan testing. Where can I get more information on these?

thank you.
 

SCAN is internal scan circuitry, Boundry Scan is boundary test cells, such as JTAG.
 

Scan based testing is a method of testing internal logic in the chip by converting existing flip-flops in the design into scan chains, so that there are easily controllable and observable.
Boundary scan testing is a method of testing the connections external to the chip (mainly from the I/O pad through the package to the interconnects on the system board to another chip with boundary scan cells). This is done by adding boundary scan cells on the I/Os of the chip. Each boundary scan cell contains circuitry that can force logic on the outputs and capture logic on the inputs.
You can look at many previous posts on this forum for more info.
 
nani_1981 said:
difference between the SCAN based testing and Boundary scan testing.
Click to expand...
Scan based test technique is to test the internal logic of chip.
Boundary scan test technique is to test the interface of chip, usually PCB interface.

nani_1981 said:
Where can I get more information on these?
Click to expand...
You can get the UG of DFT complier/ TMAX of Synopsys or FastScan of Mentor. There are not only the basic knowledge of DFT and the common methodology to finish the DFT.

Good Luck
 

hi,
Thank you guys for replying me with basic difference. Alex thank you for the details. I will go through those.
bye.
 

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