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Scan based test generation in synopsys tetramax

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manjarip

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Hi,

I am trying to generate scan based test patterns for sequential circuit (iscas s27 for example) for testing only the compinational part for stuck-at faults. I have followed the required steps (providing the scan inserted circuit, .spf files), however the collapsed fault list shows the faults in test_se,test_so, test_si , CK and the clocks and scan enable etc for each flip flops etc in addition to the faults in the combinational logic. Please help!
 

Can you please let us know what is your exact question?

Hello,

Thank you for your reply. My query is
How to run the tetramax ATPG to test a sequential circuit using a scan chain ?
 

Are you interested for TetraMAX ATPG flow?
If yes, then just go through the user guide/tool manual. There after let us know whatever you have a doubts.
Tool manual contain all the mandatory steps/ required files/ how to perform. So request you to just go through it.
 
Yes. Thank you for your reply. I am going through the tutorial.
 

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