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scan test theory
People insert scan design (scan chains) in original circuit so that the controllability and observability of the circuit have been improved, i.e. the testability of the circuit has been improved. Besides this benefit, with the insertion of scan chains, the complexity of ATPG...
I'm using fast scan to generate transition test patterns for a circuit.
Here are the results:
Order is : Detected Aborted AU Redundent Undetected
shift mode: 2870 23 121 3 20
non-shift mode: 2997 6...
Re: on ATPG?
"Check PO mismatch": Compare the primary outputs with correct values
" Check SO mismatch": Compare the scan-chain outputs with correct values
In my experience, when I want to implement a larger memory block, I have to use IP core so that I can use the flash memory on the FPGA board (PCB) . Otherwise, FPGA will systhesize my memory block using FFs and that will exhaust all useable FFs inside FPGA.
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