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what I mean is that when I do fault simulation, besides atpg pattern as you metioned, there is another type of test pattern called functional test pattern. That is what I mean of stimuli. Well, for example is I have a block that donot have a scan chain. So it has a low test coverage after atpg...
sure! for example, I have a soc design and when I use tmax, I need to use the tcl #run_build_model chip (which is the top model). After the #run_fault_sim, tmax calculate the test coverage of the chip (top level in this case). My question is how to add some stimuli file into a sub module (such...
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