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In order to reduce the package cost, I want use serdes data pins as scan data pin.
So, I can take tx_n/tx_p and rx_n/rx_p as 10 scan_in and scan_out data.
Is there a methodology to achive this goal?
thx
set_dft_signal -view
It's kind of you to help me.
But can't catch you, could you mind depicting in detail.
What is the difference between test clock and test point clock?
From the very begining of my involving in dft, I think the command create_test_clock as a declaration of test clock.
When we...
set_dft_signal
Who can tell me the difference between test_point_normal_data_clock and test_point_clock for the "set_dft_signal" command used in Autofix of DFT compiler?
thanks
There is a path between D and CK, this is useful when check the Dff setup and hold.
But I don't think there is a path from CK, though D, and reach some other endpoints
max transition time violation
the transition is decided by two factors: one is the input slew (transition), one is output load(including wire cap and fanout).
If anyone of them is over the limit of Lookup Table in std cell library, inaccuracy is produced. So, fixing max_transition violation is...
dc synthesis remove assigns
If you don't fix assign, the astro may fail to pass drc.
There are many articles to explain in solvnet, though they may not take effect as you expect in fact.
You can write a script to modify the netlist.
If the macro is a digital block, you can generate the timing model by gate level STA tool such as PrimeTime. If it is a mix-signal or analog, the transistor level STA tool pathmill may be a solution.
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