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If there are N flops in scan chain, how will be determine the location of faulty flip in scan chain?
Also how to detect STR, STF, Fast, Slow, Fast Rise, Fast Fall faults using Flush pattern?
Hi,
Lockup latches do not have testability features. It will be ignored during normal functional mode, since the output of this latch will go to SI of next FF(Clk domain 2), Which will be disabled during functional mode.
Sunil
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