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Regarding systematic mismatch-For mismatch charcaterization of capacitors, parallel combination of unit capacitors has been taken.These provides a constant area/periphery ratio and avoid process induced systematic errors. how?
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thanx for valuable information, but now another doubt arises. Does it mean that common centroid approach not only improves systematic mismatch, but also reduces random fluctuations.
According to pelgrom model-for equal distances, if no of samples are taken , then it follows a linear curve b/w...
if i use common centroid approach for elimination of systemnatic mismatch, how does it affect random mismatch. In my views, it will increase random mismatch, as we are decreasing the size while using common centroid approach, because instead of taking big one capacitor, we are now taking array...
if i use common centroid approach to reduce systematic mismatch, then using this approach,will it lead to increase in random mismatch?( because ultimately in common centroid approach, small units are taken instead of big one)
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