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you may also check "Delay Fault Testing for VLSI Circuits"
and "Testing of Digital Systems". The latter covers a broader set of topics
regarding testing (includes also info about delay testing)
Tetr@m@x engines
Hi all
Anobody knows the difference among atpg engines?
says basic scan for scan and sequential for memory elements (ff/latch/mem)
but when i use sequential engine on combinational design i get better coverage than basic scan
shouldn't be the same? any ideas?
Hi all,
has anyone used sequential atpg engine of Tetramax with combinational circuits?
It tends to give higher test coverage than basic-scan engine.
Anybody knows if this is all right to do ?
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