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Normally, increase the voltage, the cell will run fast, so the delay change small.
for the temperature, high temperataure will inclease the delay value.
So in 90nm, 130nm and above, the corner is defined as follows:
Best case: High V, Low T(0 centi degree),
Typical case: Norm V, Norm...
Re: handling reset during transition fault pattern generatio
You can just add pin constraints on the reset signal. that is set the pin to the constant value and it will not toggle in the at speed test.
I am really sorry ask this question in this forum.
But where can I find the ebook?
I can not find the forum"EDA E-Book, Articles & Specification" in the list at all. Does it have some limitation?
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