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I am running MC simulations, I want to view the effect of both mismatch and process variations, however, I am not sure how the simulation works, does this mean that each run will be at a different process and devices are mismatched within the same process of that run? or does it mean that...
Actually I am designing an integrated circuit, and it is working on 1.6GHz so it i need a speed efficient design. Sorry for not mentioning this in the beginning.
Thank you
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