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Yeah, I'm definitely interested in it. In my grad work I analyze techniques for gate delay measurement. To elucidate this matter completely I wanted to double check whether oscilloscope approach is possible or not.
By the way, ROs are good enough and I focused on them in my work.
As far as I...
Is there a probe system for getting transient response in deep-submicron (like 20-90 nm) technology node? I have encountered dozens of I/V curve measurement systems. But is it possible to measure gate delay with probe equipment? Have you seen these? What is the precision of these techniques?
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