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I have a problem. I have a 2 GDS files.
File1 has topcell1 and NAND cell. topcell1 has hierachy of 6 NAND cells. topcell1 and NAND cell have texts for ports and nets.
File 2 has only topcell2. topcell2 has texts too.
If i use -hier i can get gds file that has texts. But I don't use -hier...
I am from Japan.
There are many ASIC companies in Japan. Here is some big ones.
Toshiba, Renesas Electronics, Panasonic, Sony, Fujitsu, Mitsubishi electric, Rohm
Thine, Mega Chips, Kawasaki microelectronics, Sharp, Canon etc.
failure analysis manager
I have Failure Analysis experience. Worked for systematic failure cause of via positions in Japan. But my experience is only 1 year.
set timing derate and on chip variation
OCV is on chip variation.
SSTA(Statistical static timing analysis) use OCV. Deration is coefficient of variation. If we use deriation we can use STA instead of SSTA.
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