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I think this is the best paper...but you need to have IEEE login to download...
Best/worst case extraction and yield cost estimation using Monte Carlo statistical analysis
Belova, N.; Aronowitz, S.; Dong, J.; Puchner, H.
Page(s): 91-94 vol.1
Digital Object Identifier 10.1109/SMICND.2000.890194
Abstract | Full Text: PDF (280 KB)
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