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IDD current failure in a CMOS process ASIC

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tia_design

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Hi, All,

We just got a new tape-out. One the same wafer, about 60% failure because of big IDD current. Most of those failure and at the edge of the wafer. We measured the IDD by stepping up the VDD voltage. I-V curve look like a forward biased diode. Could anyone tell me what could be the problem. Thanks!
 

It's difficult to hazard a guess, but the 1st place I would look is to at the DRC report and make sure there isn't anything in there that shouldn't be.
 

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