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You might be aware of the various kind of faults that exists .
of them struck at and at speed faults are tha main types that we target while pattern generation for fault coverage.
The transition or the at-speed faults are those faults that we check if the transition at the input side is really getting reflected at the output side with-in a clock cycle.
These kind of faults will be targetted in AC-SCAN.
Second type is a Struck at fault. Here we target if any node is permanently struck either at Logic '1' or Logic '0'.These kind of faults are targetted in DC-SCAN.
Hope this gives you a clear picture about what you are looking for
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