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the power in function mode and test mode?

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wyyshaken

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can anyone tell me why Circuit activity is substantially higher during test than during functional mode?
thanks!
 

One of the goals of ATPG is to test the design in as few patterns as possible. Therefore, the patterns generated tend to toggle much larger numbers of nets each cycle than would normally occur in functional mode. E.g. in functional mode, you may have some control registers that stay constant, or some circuitry that isn't used all of the time. However, in test mode, these will constantly be toggling / active.
 

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