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As we know that in library we have cell information. In cell information we have max_transition time details related with that cell pin.
Now does this transition time for that cell remains static with changing in input frequency during my gate level simulation?
If no, on what will be its next...
Can we apply pattern generated in ATPG for Stuck fault to IDDq fault or Transition Fault?
If yes, when can we do it? Is it beneficial? Is any extra condition needed for it?
If no, why can't we apply it? What should we do to make it applicable?
Please be as brief as possible. Also provide is...
Consider the below circuit:
From it you can see two stuck fault at two different point.
Here we will conclude that their is no pattern which can detect both the fault at a time.
And while applying test pattern for any one fault will give the expected output and not the faulty output. So the...
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