Welcome to our site! EDAboard.com is an international Electronics Discussion Forum focused on EDA software, circuits, schematics, books, theory, papers, asic, pld, 8051, DSP, Network, RF, Analog Design, PCB, Service Manuals... and a whole lot more! To participate you need to register. Registration is free. Click here to register now.
Simply write a behavioral array and write processes to define its rd/wr method, 1/2 port, etc. the synthesizer in FPGA will convert it to its own RAM, of course sometimes have performance degrade when it doesn't fit in the original one.
Design for Test is big problem, there is no single complete solution for everything. If you simply want to test your own simple logic and use scan method, you can check this article: Ten Commandments of Scan Design, If you want to use BIST for memory test, it is usually provided by the vendor...
I am not very sure about your problem. What are you supposed to do with your rom? If you just want to verify your design, you didn't need to care its implementation and simply model it as an array of integers or array of std_ulogic. All you need to do is in your testbench you first write it the...
design compiler net name
You cannot make sure all the name of all your internal wires is the same as before, adapt to these changes and don't count on post simulation a lot in verification.
Hi,
It's not clear what's dr, ad_bus_out and what you really want to implement for those 2 signals. One thing you should keep in mind is to make the sensitivitly list complete in process if you want to use process.
Or else, Another way maybe just as simple as:
ad_bus <= ram_bus when rd = '0'...
How did you get the IP? By luck You also get a behavioral model then everything is easy. Or else you have to read the sepecification of UART and generate your own testbench for it.
atalanta atpg download
Source code inside, can revise it yourself, hehe. Disadvantage is that it requires the input format.
Uploaded file: **broken link removed**
Basically two methods in DFT, scan-based design and BIST; scan-based design can reach high fault coverage with little design effort, but at-speed scan cost a lot using high-end testers; BIST is widely used in memory test and became more and more popular(logicBIST) because of this.
This site uses cookies to help personalise content, tailor your experience and to keep you logged in if you register.
By continuing to use this site, you are consenting to our use of cookies.